Soybean Yield Gap Analysis through Front Line Demonstration in Satpura Plateau of Madhya Pradesh

Author: R.L. Raut, V.K. Verma, R.D. Barpete, Sanjay Jain

ijeab doi crossref DOI: 10.22161/ijeab/1.2.4

Keyword: Krishi Vigyan Kendra, JNKVV, oil.

Abstract: Front line demonstration is an effective and appropriate tool to demonstrate recommended technologies among the farmers. Krishi Vigyan Kendra, Betul (M.P.) conducted 78 demonstrations on soybean since 2004-05 to 2009-10 in six adopted villages. The critical inputs were identified in existing production technology through farmers meeting and group discussion with the farmers. The six years data revealed that an average yield of demonstration plot was obtained 18.35 q/ha over local check (11.85 q/ha) with an additional yield of 6.5 q/ha and the increase average soybean productivity by 60.93%. The average technologies gap and technological index were observed to be 11.65 q/ha and technological index 38.33% respectively.

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Cite this Article:

MLA

R.L. Raut, V.K. Verma, R.D. Barpete, Sanjay Jain et al."Soybean Yield Gap Analysis through Front Line Demonstration in Satpura Plateau of Madhya Pradesh". International Journal of Environment Agriculture and Biotechnology(ISSN: 2456-1878),vol 1, no. 2, 2016, pp.122-124 AI Publications doi:10.22161/ijeab/1.2.4

APA

R.L. Raut, V.K. Verma, R.D. Barpete, Sanjay Jain, P.(2016).Soybean Yield Gap Analysis through Front Line Demonstration in Satpura Plateau of Madhya Pradesh. International Journal of Environment Agriculture and Biotechnology(ISSN: 2456-1878).1(2), 122-124.10.22161/ijeab/1.2.4

Chicago

R.L. Raut, V.K. Verma, R.D. Barpete, Sanjay Jain, P.(2016).Soybean Yield Gap Analysis through Front Line Demonstration in Satpura Plateau of Madhya Pradesh. International Journal of Environment Agriculture and Biotechnology(ISSN: 2456-1878).1(2), pp.122-124.

Harvard

R.L. Raut, V.K. Verma, R.D. Barpete, Sanjay Jain. 2016."Soybean Yield Gap Analysis through Front Line Demonstration in Satpura Plateau of Madhya Pradesh". International Journal of Environment Agriculture and Biotechnology(ISSN: 2456-1878).1(2):122-124.Doi:10.22161/ijeab/1.2.4

IEEE

R.L. Raut, V.K. Verma, R.D. Barpete, Sanjay Jain."Soybean Yield Gap Analysis through Front Line Demonstration in Satpura Plateau of Madhya Pradesh", International Journal of Environment Agriculture and Biotechnology,vol.1,no. 2, pp.122-124,2016.

Bibtex

@article { r.l.raut2016soybean,
title={Soybean Yield Gap Analysis through Front Line Demonstration in Satpura Plateau of Madhya Pradesh},
author={R.L. Raut, V.K. Verma, R.D. Barpete, Sanjay Jain , R},
journal={International Journal of Environment Agriculture and Biotechnology},
volume={1},
year= {2016} ,
}